- stacking faults
- pl.дефекты упаковки (напр., в кристаллической структуре эпитаксиального слоя)
Англо-русский словарь промышленной и научной лексики. 2014.
stacking faults
Смотреть что такое "stacking faults" в других словарях:
Semiconductor — Citations missing|date=March 2008A semiconductor is a solid material that has electrical conductivity in between a conductor and an insulator; it can vary over that wide range either permanently or dynamically. [. They are used in many… … Wikipedia
Crystallographic defect — Crystalline solids exhibit a periodic crystal structure. The positions of atoms or molecules occur on repeating fixed distances, determined by the unit cell parameters. However, the arrangement of atom or molecules in most crystalline materials… … Wikipedia
Collision cascade — A classical molecular dynamics computer simulation of a collision cascade in Au induced by a 10 keV Au self recoil. This is a typical case of a collision cascade in the heat spike regime. Each small sphere illustrates the position of an atom, in… … Wikipedia
Abdul Qadeer Khan — HI, NI (twice) Abdul Qadeer Khan, 1999. Born 1 April … Wikipedia
Deformation (engineering) — This article is about deformation in engineering. For a more rigorous treatment, see Deformation (mechanics). Compressive stress results in deformation which shortens the object but also expands it outwards. In materials science, deformation is a … Wikipedia
Metal — This article is about metallic materials. For other uses, see Metal (disambiguation). Some metal pieces Metals Alkali metals … Wikipedia
Silicon carbide — Chembox new Name = Silicon carbide ImageFile = Silicon carbide 3D balls.png ImageSize = 140px ImageName = Ball and stick model of part of a crystal of SiC ImageFile1 = silicon carbide detail.jpg ImageSize1 = 140px OtherNames = Section1 = Chembox… … Wikipedia
Silicon on sapphire — (SOS) is a hetero epitaxial process for integrated circuit manufacturing that consists of a thin layer (typically thinner than 0.6 micrometres) of silicon grown on a sapphire (Al2O3) wafer. SOS is part of the Silicon on Insulator (SOI) family of… … Wikipedia
Post-perovskite — is a high pressure phase of MgSiO3, is composed of the prime oxide constituents of the Earth s rocky mantle (MgO and SiO2), and its pressure and temperature for stability imply that it is likely to occur in portions of the lowermost few hundred… … Wikipedia
Diffraction topography — (short: topography ) is an X ray imaging technique based on Bragg diffraction. Diffraction topographic images ( topographs ) record the intensity profile of a beam of X rays (or, sometimes, neutrons) diffracted by a crystal. A topograph thus… … Wikipedia
Еременко Виктор Валентинович — Виктор Валентинович Еременко Дата рождения: 26 июля 1932(1932 07 26) (80 лет) Место рождения: г. Харьков, Украина, СССР Страна … Википедия
